Optical properties of Cd1−xMgxTe epitaxial layers: A variable‐angle spectroscopic ellipsometry study

Autor:	Michel Luttmann, François Bertin, Amal Chabli
Rok vydání:	1995
Předmět:	Permittivity Wavelength Materials science Condensed matter physics Extinction (optical mineralogy) Ellipsometry Analytical chemistry General Physics and Astronomy Epitaxy Ternary operation Refractive index Molecular beam epitaxy
Zdroj:	Journal of Applied Physics. 78:3387-3391
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.360710
Popis:	The index of Cd1−xMgxTe ternary alloys was measured for the first time by variable‐angle spectroscopic ellipsometry on layers of different concentrations. The ellipsometer’s wide spectral range (0.7–5.6 eV) clearly reveals critical points beyond the gap. Self‐consistency of the permittivity measurements is investigated by Kramers–Kronig analysis. A transition layer is revealed at the top surface of the samples and is taken into account as a rough layer. In the transparent region Sellmeier’s law is applied to describe the index behavior as a function of the wavelength and the magnesium content.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1fa7da1e5d7a8d6b9f20b47dba90c8f0 https://doi.org/10.1063/1.360710 Zobrazit plný text záznamu