The model of the influence of the electron refluxing on the electron transport andKαemission
| Autor: | Lihua Cao, Y.Q. Gu, Chunyang Zheng, J. Liu, J. C. Zhao, Jianhua Zheng, Zhanjun Liu, He Zhang, Z. Q. Zhao |
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| Rok vydání: | 2017 |
| Předmět: |
Materials science
Energy conversion efficiency Analytical chemistry Electron Radiation Photon energy Condensed Matter Physics 01 natural sciences Electron transport chain Atomic and Molecular Physics and Optics 010305 fluids & plasmas Electric field Yield (chemistry) 0103 physical sciences Cathode ray Electrical and Electronic Engineering 010306 general physics |
| Zdroj: | Laser and Particle Beams. 35:483-491 |
| ISSN: | 1469-803X 0263-0346 |
| DOI: | 10.1017/s0263034617000465 |
| Popis: | In our previous research (Zhaoet al., 2016), we focus on the transport processes from hot electrons toKαX-ray emission in a copper foil and nanobrush target when the electron refluxing effect is not taken into account. In this work, considering the refluxing effect, the transport of hot electrons in a solid target is studied by adding the electric fields both at the front and rear surfaces of the target with Monte Carlo code Geant4. Simulation results show that the electron refluxing has an important influence onKαphoton yield and the size ofKαradiation source.Kαyield from the 10-μm-thick target with the electron refluxing effect is 2.7–3.7 times more than that without the refluxing for the electron temperatures from 0.4 to 1.4 MeV. The laser-to-Kαphoton energy conversion efficiency${\rm \eta} _{L \to K_{\rm \alpha}} $with the refluxing effect is always higher than that without the refluxing, and both of them decrease gradually with laser strengthIλ2. Considering the electron refluxing effect or not, the variations ofKαyield with the target thicknessdare very different. A critical thickness of the targetdc(~30 μm) is achieved to confirm whether the refluxing effect is valid for the target. For the target with the thicknessdless thandc, the refluxing effect can enhanceKαyield with several times, while for the target with the thicknessdlarger thandc, the refluxing effect is not so effective. The full-width at half-maximum increases from 23 to 56 µm after including the refluxing effect by the electron beam with the radius of 10 µm and the temperature of 400 keV. |
| Databáze: | OpenAIRE |
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