| Autor: |
Ayan Kanti Pradhan, Shubhendu Maiti, Salil Kumar Biswas, Sanjay Mondal, Manabendra Maiti, Kausik Bhattacharyya |
| Rok vydání: |
2022 |
| DOI: |
10.21203/rs.3.rs-1289420/v1 |
| Popis: |
A novel technique based on cavity perturbation for the characterization of dielectric properties of medium and low loss homogeneous cylindrically shaped materials using a single iris coupled rectangular resonator in Ka and millimeter-wave band frequencies is presented in this paper. The relative real permittivity and the dielectric loss have been calculated from the formulated analytical equations using the simulation measurements of unperturbed and loaded cavity resonators. Simulated results demonstrate degradation in accuracy of the derived relative dielectric constant at higher-order sample radius. Finally, a first-order correction factor has been applied to stabilize the derived dielectric permittivity of selective dielectric samples measured at two respective frequencies, 36.624 GHz and 52.263 GHz. Using this modification stable and optimized dielectric constant of any dielectric types with extended operating radius can be obtained with a high degree of absolute accuracy. And thus the restrictions imposed by different cavity based measurement techniques on the selection of precise sample dimensions can be resolved. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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