AXON Dose: A Solution for Measuring and Managing Electron Dose in the TEM

Autor:	John Damiano, Stamp Walden, Alan Franks, Kate Marusak, Ben Larson, Mike Coy, David Nackashi
Rok vydání:	2022
Předmět:	General Computer Science
Zdroj:	Microscopy Today. 30:22-25
ISSN:	2150-3583 1551-9295
Popis:	The interaction of the electron beam with materials during TEM/STEM imaging often leads to radiation damage. While a variety of low-dose techniques can help mitigate beam damage, true dose management starts with knowing the precise total accumulated dose and dose rate that a sample has seen throughout an experiment. AXON Dose allows users to calibrate their instruments, track electron dose/dose rate across a sample as a function of time and location, and quantify the impact of dose on individual samples.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1f6e3dbe8dc49acc2c089f5b1d20d144 https://doi.org/10.1017/s1551929522000840 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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