| Autor: |
N. Zameroski, Edl Schamiloglu, J. Gaudet, T. Svimonishvili, Mark Gilmore |
| Rok vydání: |
2004 |
| Předmět: |
|
| Zdroj: |
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786). |
| DOI: |
10.1109/ivelec.2004.1316243 |
| Popis: |
One of the major problems affecting the efficiency of high-power microwave devices is that of secondary electron emission from the collector. It is a well known that the efficiency of these devices can be greatly improved by using depressed collectors comprised of low yield materials. This experimental research benchmarks existing material's secondary electron yield curves, and also investigates time dependent thermal transient effects on secondary electron yield. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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