Texturing in a Ni–W/TiN Thin-Film System
| Autor: | M. S. Sungurov, V. A. Finkel |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Physics and Astronomy (miscellaneous) Alloy chemistry.chemical_element Substrate (electronics) engineering.material equipment and supplies 01 natural sciences Crystal Coating chemistry 0103 physical sciences engineering Texture (crystalline) Thin film Composite material 010306 general physics Tin Layer (electronics) |
| Zdroj: | Technical Physics. 63:1182-1188 |
| ISSN: | 1090-6525 1063-7842 |
| DOI: | 10.1134/s1063784218080200 |
| Popis: | Double-layer thin-film compositions with a TiN coating based on a ferromagnetic Ni–5 at % W alloy and a paramagnetic Ni–9.5 at % W alloy have been prepared. Texturing in both components of the Ni–W/TiN system has been studied using X-ray diffraction analysis. It has been found that the coating layer causes crystal planes in the Ni–9.5 at % W strip to reorient and thereby enhances the cube texture in the substrate. It has been shown that under certain growth conditions, a thin TiN coating above the Ni–9.5 at % W/TiN substrate grows quasi-single-crystalline with a cube texture. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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