Using circularly polarized soft x rays to probe antiferromagnetically correlated Co/Cu multilayers

Autor:	Shane Stadler, J. A. Borchers, Joseph Dvorak, Yves Idzerda
Rok vydání:	2004
Předmět:	Physics Condensed matter physics Scattering General Physics and Astronomy chemistry.chemical_element Copper Molecular physics Domain wall (magnetism) chemistry Ferromagnetism Absorption edge Antiferromagnetism Specular reflection Cobalt
Zdroj:	Journal of Applied Physics. 95:6672-6674
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1669311
Popis:	X-ray resonant magnetic scattering was used to study the antiferromagnetic correlation between weakly coupled Co layers in a [Co(6 nm)|Cu(6 nm)]20 multilayer. Half-order peaks were observed for standard specular θ–2θ scans with the energy of the incident x rays tuned to the Co L3 absorption edge. Three characteristic lengths were extracted from fits to the multicomponent 3/2-order diffuse spectrum: average correlated domain size, average correlated domain wall thickness, and average in-plane structural correlation length.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1f07cb33abff545cec6d82083571e06e https://doi.org/10.1063/1.1669311 Zobrazit plný text záznamu