| Autor: |
Ke Xie, Chang Jiang Song, Shi Chao Zhao, Qijie Zhai |
| Rok vydání: |
2013 |
| Předmět: |
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| Zdroj: |
Advanced Materials Research. :224-229 |
| ISSN: |
1662-8985 |
| Popis: |
Transmission electron microscopy (TEM) can be utilized to identify some specific microstructures of metals and alloys. However, it is very difficult to precisely prepare a TEM specimen from the powder particles with several micrometers. There are more or less drawbacks in conventional preparation method. This paper describes a novel method to prepare specific specimens from the powder particles with several micrometers for TEM study. A TEM specimen approximately 5μm diameter was successfully prepared to electron transparency, which extracted from a 5μm diameter powder particle. The selected-area electron diffraction pattern (SAED) analysis was carried out. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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