Lightweight Read Reference Voltage Calibration Strategy for Improving 3-D TLC NAND Flash Memory Reliability

Autor:	Hua Feng, Debao Wei, Yongchao Wang, Yu Song, Zhelong Piao, Liyan Qiao
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Device and Materials Reliability. :1-1
ISSN:	1558-2574 1530-4388
DOI:	10.1109/tdmr.2023.3280262
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1ef7a052bbddf8f4f71b7e2277931256 https://doi.org/10.1109/tdmr.2023.3280262 Zobrazit plný text záznamu