Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films’

Autor:	Robert L. Opila, Thierry Conard, John T. Grant, Julia E. Fulghum, Keisuke Kobayashi, H. Nohira, Robert M. Wallace, J. Wolstenholme, G. Conti, Alberto Herrera-Gomez, László Kövér, Francisco S. Aguirre-Tostado, Wolfgang S. M. Werner, S. Oswald, R. W. Paynter, C. R. Brundle, M. Jenko, Peter J. Cumpson, Charles S. Fadley
Rok vydání:	2009
Předmět:	X-ray photoelectron spectroscopy Chemistry Nano Materials Chemistry Analytical chemistry Nanotechnology Surfaces and Interfaces General Chemistry Condensed Matter Physics Surfaces Coatings and Films
Zdroj:	Surface and Interface Analysis. 41:840-857
ISSN:	0142-2421
DOI:	10.1002/sia.3105
Popis:	Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films’ A. Herrera-Gomez,a,b∗ J. T. Grant,c P. J. Cumpson,d† M. Jenko,e F. S. Aguirre-Tostado,b C. R. Brundle,f T. Conard,g G. Conti,h C. S. Fadley,i J. Fulghum,j K. Kobayashi,k L. Kover,l H. Nohira,m R. L. Opila,n S. Oswald,o R. W. Paynter,p R. M. Wallace,b W. S. M. Wernerq and J. Wolstenholmer
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1eea9e56f4a89b7ff5eb791f6f9a151d https://doi.org/10.1002/sia.3105 Zobrazit plný text záznamu Plný text