| Popis: |
A lead-free system, BaTi(1−x)ZrxO3, with x varying from 0.00 to 0.15 (in steps of 0.05), were prepared by solid state reaction method. X-ray diffraction study confirms the perovskite-type tetragonal structure with, a = 4.003 A and c = 3.998 A for pure BaTiO3 and a = 4.027 A and c = 4.023 A for pure BaTi0.85Zr0.15O3. Microstructure changes, with Zr4+ in BaTi(1−x)ZrxO3, are studied using scanning electron microscopy (SEM). Dielectric constant measurements show the maximum dielectric constant value (~ 9445) for a composition, BaTi0.85Zr0.15O3. P-E loop measurements support ferroelectric nature for all the samples and maximum polarization value (~10.55 µC/cm2) with squareness ratio ~0.6, at electric field 7.11 kV/cm, is obtained for BaTi0.85Zr0.15O3 composition. All the measured properties suggest that the BaTi0.85Zr0.15O3 may be suitable for memory device applications. |
