Fast fault localization based on deep learning in optical networks

Autor:	Liang Chen, Yang Li, Shuang Ma, Yinji Jing, Hongxi Zhou, Xiaoshuang Gu, Qiwei Zheng, Fei Wang, Yongli Zhao
Rok vydání:	2023
Zdroj:	9th Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA2022).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1ee1f333c1580d452f33540ee346acd7 https://doi.org/10.1117/12.2666426 Zobrazit plný text záznamu