On the possibility of application of x-ray diffraction edge contrast for the quantitative determination of high-energy heavy ion range in silicon
| Autor: | J. Auleytner, Jadwiga Bak-Misiuk, Z. Furmanik, J. Morawiec |
|---|---|
| Rok vydání: | 1988 |
| Předmět: |
High energy
Range (particle radiation) Silicon media_common.quotation_subject Analytical chemistry chemistry.chemical_element General Chemistry Edge (geometry) Condensed Matter Physics Quantitative determination chemistry X-ray crystallography Contrast (vision) General Materials Science Heavy ion media_common |
| Zdroj: | Crystal Research and Technology. 23:K20-K24 |
| ISSN: | 1521-4079 0232-1300 |
| DOI: | 10.1002/crat.2170230124 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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