Profilometer of secondary beams based on a multiwire proportional chamber

Autor:	E. R. Markaryan, Yu. E. Penionzhkevich, S. M. Lukyanov, V. I. Smirnov, R. V. Revenko, R. A. Astabatyan, V. A. Maslov
Rok vydání:	2010
Předmět:	Wire chamber Optics Materials science business.industry Physics::Accelerator Physics Particle Profilometer Current (fluid) business Instrumentation Beam (structure) Ion
Zdroj:	Instruments and Experimental Techniques. 53:484-489
ISSN:	1608-3180 0020-4412
DOI:	10.1134/s0020441210040032
Popis:	A profilometer for diagnostics of secondary ion beams with Z ≥ 2 is described. Two methods of beam profile measurements are compared: a counting method, when pulses from each particle are registered, and a current method with channel-by-channel measurement of the integral current. The counting characteristics and the lifetimes of the profilometer for these methods of beam profile measurements are compared.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1e7cac622a58b1a33861b1ebbacd4914 https://doi.org/10.1134/s0020441210040032 Zobrazit plný text záznamu Plný text ve formátu PDF