Strain profiling of fatigue crack overload effects using energy dispersive X-ray diffraction
| Autor: | Tony Fast, Igor Zakharchenko, Mark Croft, John Skaritka, Thomas Tsakalakos, M. Lakshmipathy, Zhong Zhong, Najeh Jisrawi, R.L. Holtz, K. Sadananda |
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| Rok vydání: | 2005 |
| Předmět: |
Diffraction
Materials science Mechanical Engineering X-ray Fatigue testing Industrial and Manufacturing Engineering Synchrotron law.invention Crystallography Mechanics of Materials Constant stress law Modeling and Simulation X-ray crystallography Optical surface General Materials Science Composite material Energy-dispersive X-ray diffraction |
| Zdroj: | International Journal of Fatigue. 27:1408-1419 |
| ISSN: | 0142-1123 |
| Popis: | Synchrotron based energy dispersive X-ray diffraction has been used to profile the strains around fatigue cracks in 4140 steel test specimens. In particular strain field comparisons were made on specimens prepared: with initial constant stress intensity fatigue; with this initial fatigue followed by a single overload cycle; and with this fatigue-overload sequence followed by an additional constant stress intensity fatigue. The strain profiles behind, at and in-front-of the crack tip are discussed in detail. Selected strain profiles measurements under in situ applied tensile stress are also presented. The technique of optical surface height profiling reveals surface depression effects which can be correlated with the interior strain profiles. |
| Databáze: | OpenAIRE |
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