Cryogenic cooling of monochromators
| Autor: | M. Rossat, G. Marot, Dean Chapman, M. Iarocci, St. Joksch, E. Ziegler, Lin Zhang, Andreas K. Freund, L. E. Berman, Jerome B. Hastings, H. Kawata |
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| Rok vydání: | 1992 |
| Předmět: | |
| Zdroj: | Review of Scientific Instruments. 63:477-480 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1142736 |
| Popis: | In this paper, we report on the design and x‐ray diffraction properties of cryocooled silicon single crystals exposed to the following wiggler beams: power density: 150 W/mm2, total power: 75 W and power density: 0.5 W/mm2, total power: 100 W. First, thermomechanical and engineering aspects of low‐temperature crystal cooling are discussed, leading to two basic cooling geometries: internal cooling and side cooling. Experimental tests of both these cooling schemes at NSLS on beam lines X25 and X17 are then described and discussed. Finally, engineering problems related to the integration of cryogenic cooling on ESRF beam lines are presented. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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