| Autor: |
Seongwon Kim, Ted R. Lundquist, Herschel A. Ainspan, Young H. Kwark, Franco Stellari, Alan J. Weger, Christian W. Baks, Peilin Song, Dzmitry Maliuk, Vikas Anant, Ulrike Kindereit |
| Rok vydání: |
2013 |
| Předmět: |
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| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa2013p0182 |
| Popis: |
In this paper, we present a Superconducting Nanowire Single Photon Detector (SnSPD) system and its application to ultra low voltage Time-Resolved Emission (TRE) measurements (also known as Picosecond Imaging Circuit Analysis, PICA) of scaled VLSI circuits. The 9 µm-diameter detector is housed in a closed loop cryostat and fiber coupled to an existing Emiscope III tool for collecting spontaneous emission light from the backside of integrated circuits (ICs) down to a world record 0.5 V supply voltage in a few minutes. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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