Thermal monitoring of a single heat source in semiconductor devices — the first approach

Autor:	Andrzej Napieralski, Wojciech Wójciak
Rok vydání:	1997
Předmět:	Materials science business.industry Detector General Engineering Electrical engineering Semiconductor device Integrated circuit Temperature measurement law.invention Temperature gradient law business Focus (optics) Measured quantity Voltage
Zdroj:	Microelectronics Journal. 28:313-316
ISSN:	0026-2692
DOI:	10.1016/s0026-2692(96)00034-1
Popis:	The paper presents an idea of a gradient direction sensor (GDS) which in the simplest case consists of three sensors properly placed and transforming signals from the measured domain to electrical ones. The voltage values obtained give (after computing) information about the gradient direction of the measured quantity and its absolute value. In the first approach we focus on the implementation of GDS to the temperature measurement of a single heat source placed on the surface of a semiconductor device. We propose an arrangement of a few GDSs in order to detect the presence of single heat source on the surface of an IC.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1e3b7722618a148f1ebbc519711586fa https://doi.org/10.1016/s0026-2692(96)00034-1 Zobrazit plný text záznamu Full Text from ScienceDirect