Predict the product specific CDM stress using measurement-based models of CDM discharge heads
| Autor: | Friedrich zur Nieden, Reinhold Gartner, Kai Esmark, Stefan Seidl |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Engineering Electrostatic discharge business.industry Peak current 020206 networking & telecommunications Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology 01 natural sciences Automotive engineering Stress (mechanics) JEDEC memory standards Frequency domain Product (mathematics) 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electronic engineering Waveform Time domain business |
| Zdroj: | 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD). |
| DOI: | 10.1109/eosesd.2016.7592542 |
| Popis: | The introduction of the CDM Joint Standard has an impact on the electrical properties of the tester hardware due to updated waveform requirements. Models of different CDM discharge heads are generated using measurement data in frequency domain. Discharge currents of a device are simulated according to the different standards in time domain. In comparison to the popular but replaced JEDEC standard peak current levels have increased. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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