Origin of luminescence from porous silicon deduced by synchrotron-light-induced optical luminescence
| Autor: | S. P. Frigo, X.H. Feng, D. C. Houghton, J. W. Lorimer, B. Bryskiewicz, K. H. Tan, D.T. Jiang, I. Coulthard, Tsun-Kong Sham, R. A. Rosenberg |
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| Rok vydání: | 1993 |
| Předmět: |
Amorphous silicon
Multidisciplinary Condensed matter physics Silicon business.industry chemistry.chemical_element Porous silicon Synchrotron Spectral line law.invention X-ray absorption fine structure chemistry.chemical_compound chemistry law Optoelectronics business Luminescence Absorption (electromagnetic radiation) |
| Zdroj: | Nature. 363:331-334 |
| ISSN: | 1476-4687 0028-0836 |
| DOI: | 10.1038/363331a0 |
| Popis: | FOLLOWING reports of intense optical luminescence from porous silicon1,2, the opportunity for engineering optoelectronic devices using this material3,4 has attracted considerable attention. At present, however, the question of the origin of the luminescence has not been fully resolved5. The quantum-confinement model6–8 suggests that a quantum size effect gives optical transitions, and hence luminescence, in the visible range—this idea gains support from the wavelength dependence of the luminescence on porosity. An alternative model9,10 attributes the luminescence to siloxene-like compounds11 formed on the silicon surface. A third model, which invokes hydrogenated amorphous silicon as a possible source12,13, seems to be contradicted by X-ray absorption fine structure (XAFS) studies14–16. Here we report optical luminescence in porous silicon and siloxene induced by soft X-rays with energies near the silicon K-edge (1,839 eV). Using the luminescence together with the total electron yield, we can obtain the XAFS spectra for the luminescent sites in both materials. Our results show that the luminescence from porous silicon does not derive from siloxene (either freshly prepared or annealed), and thus suggest that the quantum-confinement model seems to provide the only viable explanation. |
| Databáze: | OpenAIRE |
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