Characterization methods of epitaxial Sr2FeMoO6 thin films

Autor:	Karim Bouzehouane, M. Besse, J. Olivier, R. Bisaro, J.-P. Contour, Albert Fert, F. Wyczisk, F. Pailloux, A. Barthélémy, Olivier Durand
Rok vydání:	2002
Předmět:	Materials science Nucleation Mineralogy Crystal growth Condensed Matter Physics Epitaxy Microstructure Pulsed laser deposition Inorganic Chemistry Magnetization Electrical resistivity and conductivity Materials Chemistry Thin film Composite material
Zdroj:	Journal of Crystal Growth. 241:448-454
ISSN:	0022-0248
DOI:	10.1016/s0022-0248(02)01285-x
Popis:	We have investigated the microstructure and the magnetic properties of Sr 2 FeMoO 6 thin films deposited on (0 0 1)-SrTiO 3 substrates by pulsed laser deposition. We have checked the influence of oxygen pressure on the roughness and the resistivity of the films. We found a narrow range of pressure (∼5×10 −6 Torr) leading to conductive films. Fixing the oxygen pressure at this value, we have performed a structural analysis for two characteristic samples grown at different temperatures. We have revealed the nucleation of iron-rich parasitic phases, the content of which depends on the growth temperature. The role of these Fe-rich inclusions on the electrical and magnetic properties of the SrFeMoO 6 films is also discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1ddcd6bec3a1857ce0724b9f8ab9a2f1 https://doi.org/10.1016/s0022-0248(02)01285-x Zobrazit plný text záznamu Full Text from ScienceDirect