Scanning electron microscopy of field-emitting individual single-walled carbon nanotubes
| Autor: | Alireza Nojeh, R. Fabian Pease, Aaron W. Baum, Hongjie Dai, W.K. Wong |
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| Rok vydání: | 2004 |
| Předmět: |
Conventional transmission electron microscope
Materials science Physics and Astronomy (miscellaneous) business.industry Scanning electron microscope Astrophysics::High Energy Astrophysical Phenomena Scanning confocal electron microscopy Nanotechnology Mechanical properties of carbon nanotubes Carbon nanotube law.invention Condensed Matter::Materials Science Field electron emission law Optoelectronics Electron beam-induced deposition business Environmental scanning electron microscope |
| Zdroj: | Applied Physics Letters. 85:112-114 |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.1763984 |
| Popis: | Carbon nanotubes are promising electron emitters because of their sharp geometries that lead to significant external field enhancement, as well as their mechanical strength. However, distinguishing the emission due to an individual single-walled carbon nanotube (SWCNT) from that due to surrounding structures is a challenge. Here, we demonstrate how a scanning electron microscope (SEM) can be used to view the emission from individual SWCNTs by applying an external field close to the onset of field-emission and then scanning the tube with the electron beam of the SEM. The stimulated emission is revealed in the SEM image as localized bright spots. |
| Databáze: | OpenAIRE |
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