Investigation on Package Warpage and Reliability of the large size 2.5D Molded Interposer on Substrate (MIoS) Package

Autor: Soohyun Nam, Jinhyun Kang, Ilbok Lee, Younglyong Kim, Hae Jung Yu, Dae-Woo Kim
Rok vydání: 2022
Zdroj: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
DOI: 10.1109/ectc51906.2022.00108
Databáze: OpenAIRE