Immediate development of processing windows for selective electron beam melting using layerwise monitoring via backscattered electron detection
| Autor: | Fuad Osmanlic, Zongwen Fu, Christopher Arnold, Carolin Körner, Christoph R. Pobel |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Optical image
Materials science Fabrication business.industry Mechanical Engineering Process (computing) Window (computing) New materials 02 engineering and technology Backscattered electron 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences 0104 chemical sciences Optics Mechanics of Materials Cathode ray General Materials Science 0210 nano-technology business |
| Zdroj: | Materials Letters. 249:70-72 |
| ISSN: | 0167-577X |
| Popis: | The availability of a reliable processing window is the basic requirement for processing new materials via selective electron beam melting (SEBM). Typically, these processing windows are derived by a time-consuming procedure comprising fabrication, metallographic preparation and analysis of standardized specimens for every parameter set. This study demonstrates the immediate development of a processing window during one single SEBM process. An electron optical image acquisition system provides the necessary information for evaluation and subsequent adaption of process parameters. It is shown that this immediate approach delivers processing windows with sufficient accuracy, while the required time is substantially reduced from weeks or even months to several hours. |
| Databáze: | OpenAIRE |
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