Repeatability and Mismatch of Waveguide Flanges in the 500–750 GHz Band

Autor:	Alexander Arsenovic, Huilin Li, Jeffrey L. Hesler, Anthony R. Kerr, Robert M. Weikle
Rok vydání:	2014
Předmět:	Radiation Materials science Terahertz radiation business.industry Measure (physics) Repeatability Flange law.invention Optics law Reflection (physics) Calibration Electrical and Electronic Engineering Reflection coefficient business Waveguide
Zdroj:	IEEE Transactions on Terahertz Science and Technology. 4:39-48
ISSN:	2156-3446 2156-342X
DOI:	10.1109/tthz.2013.2283540
Popis:	This paper presents a study characterizing the connection repeatability and reflection coefficient of submillimeter waveguide flanges in the 500-750 GHz band (WR-1.5 or WM-380). The connection repeatability of four types of flange was measured using one-port measurements and a “load-reference” technique with a vertically mounted system to mitigate gravitational bias. To measure the error-corrected complex reflection coefficients of pairs of waveguide flanges, a calibration procedure insensitive to flange misalignment was used. This SDD(RO) calibration method employs four standards: a flush short, two delay shorts with different but unspecified offsets, and a radiating open-ended waveguide. The uncertainty associated with this calibration method is investigated and it is used to estimate the reflection coefficient resulting from flange misalignment.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1cf4aed9fcda2bef71bc563e8e05ef14 https://doi.org/10.1109/tthz.2013.2283540 Zobrazit plný text záznamu