When the Sequence of Thin Film Deposition Matters: Examination of Organic-on-Organic Heterostructure Formation Using Molecular Beam Techniques and in Situ Real Time X-ray Synchrotron Radiation
| Autor: | Rambert K. Nahm, E. R. Kish, James R. Engstrom, Arthur R. Woll |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
chemistry.chemical_classification
Materials science Analytical chemistry Synchrotron radiation Heterojunction 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Pentacene chemistry.chemical_compound General Energy chemistry Monolayer Surface roughness Physical and Theoretical Chemistry Thin film 0210 nano-technology Molecular beam Alkyl |
| Zdroj: | The Journal of Physical Chemistry C. 120:6165-6179 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/acs.jpcc.6b01717 |
| Popis: | We have examined the growth of bilayers and superlattices of pentacene and perylene derivatives (PTCDI-Cn) using in situ real time X-ray synchrotron radiation techniques and ex situ atomic force microscopy. We find that the growth of PTCDI-Cn layers on 1 monolayer (ML) of pentacene is initially 2D layer-by-layer (LbL), eventually transitioning to a mode of growth that is more 3D after several monolayers have been deposited. We find that the extent of 2D LbL growth depends on the length of the alkyl end chains, Cn: the smoothest films are formed with PTCDI-C5, while the roughest are formed with PTCDI-C13. These observations reflect a difference in the Ehrlich–Schwoebel barrier for step-edge crossing with alkyl end-chain length. When the sequence of deposition is reversed, we observe spectacular changes in the evolution of surface roughness for the growth of pentacene thin films on 1 ML of PTCDI-Cn. The growth is immediately 3D, while still remaining crystalline. The morphology of these thin films indicates... |
| Databáze: | OpenAIRE |
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