Synthetic IR signature control using emissivity enhancement techniques

Autor: S. V. Chyrchyk, James Robert Kircher, Donald R. Snyder, V. V. Bogatyrenko, Robert Lee Murrer, Oleg Yu. Malyutenko, V. K. Malyutenko
Rok vydání: 2004
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.537758
Popis: In this report, we show both theoretically and experimentally how the IR signature of a semiconductor scene (with band gap energy Eg) can be monitored through contactless emissivity control even if this scene thermometric temperature is kept constant. More specifically, we show how a scene emissivity in the spectral band beyond the fundamental absorption range (ω2 20 kHz) monitored by a shorter wavelength photo excitation of non-equilibrium charge carriers (ω1 > Eg/h, "visible range"). Experimental tests performed on Si and Ge scenes (300 < T < 600 K), demonstrate optically generated cold and hot images and, what is more important, negligible temperature contrast between an object and a background (Stealth effect in IR).
Databáze: OpenAIRE