Nanoscale potential distribution across multiquantum well structures: Kelvin probe force microscopy and secondary electron imaging
| Autor: | Massimo Mazzer, A. Schwarzman, E. Strassburg, Th. Glatzel, Amir Boag, E. Lepkifker, K. W. J. Barnham, Zahava Barkay, Yossi Rosenwaks, E. Grunbaum |
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| Rok vydání: | 2005 |
| Předmět: |
Kelvin probe force microscope
Chemistry Microscopy Scanning confocal electron microscopy General Physics and Astronomy Energy filtered transmission electron microscopy Atomic force acoustic microscopy Scanning capacitance microscopy Atomic physics Non-contact atomic force microscopy Photoconductive atomic force microscopy |
| Zdroj: | Journal of Applied Physics. 98:084310 |
| ISSN: | 1089-7550 0021-8979 |
| Popis: | Ultrahigh vacuum cross-sectional Kelvin probe force microscopy has been used to characterize In0.17GaAs∕GaAsP0.06 multiquantum well structures, together with secondary electron microscopy. Individual 8nm quantum wells were well resolved in both methods, and were found to be in a good agreement with numerical simulations of the work function profile. It is shown that the surface potential contrast in the Kelvin probe force microscopy measurements is greatly enhanced using deconvolution algorithms, and the reasons for the different contrast in the electron microscopy images are discussed. |
| Databáze: | OpenAIRE |
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