Evaluation and alleviation of SOI impacts on SRAM functionality and yield

Autor:	Rajiv V. Joshi, Rouwaida Kanj, Antonio R. Pelella
Rok vydání:	2008
Předmět:	Engineering Yield (engineering) business.industry Domino circuit Electronic engineering Process (computing) Silicon on insulator Statistical analysis Hardware_PERFORMANCEANDRELIABILITY Static random-access memory Integrated circuit design business Domino
Zdroj:	2008 IEEE International SOI Conference.
DOI:	10.1109/soi.2008.4656285
Popis:	Super fast Monte-Carlo techniques are applied to allow deeper insight to the yield of SOI domino circuit design techniques for SRAMs. For the first time, Read-before-Write in dual supply domino bit-select design is analyzed in the presence of floating body effects, hysteretic and process variations. The methodology provides greater ability to alleviate non-functionality by identifying yield-optimized operating ranges.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1c25511df90da2822d4022b0b47d23ac https://doi.org/10.1109/soi.2008.4656285 Zobrazit plný text záznamu