Evaluation methodology of thin dielectrics for non-volatile memory application

Autor:	D. Brazzelli, Gabriella Ghidini
Rok vydání:	2002
Předmět:	Non-volatile memory Materials science business.industry Optoelectronics Dielectric Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics business Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 42:1473-1480
ISSN:	0026-2714
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1c1c2042762a118c42cf9ec5f260e359 https://doi.org/10.1016/s0026-2714(02)00173-7 Zobrazit plný text záznamu Full Text from ScienceDirect