Selective formation of an ultra-thin pore seal on mesorporous low-k for a copper dual damascene structure

Autor: Kazuo Kohmura, Shoko Ono, Hirofumi Tanaka, Tsuneji Suzuki, Yasuhisa Kayaba
Rok vydání: 2014
Předmět:
Zdroj: IEEE International Interconnect Technology Conference.
DOI: 10.1109/iitc.2014.6831890
Popis: A strategy for the selective formation of a pore sealing layer on mesoporous low-k applicable for a Cu dual damascene interconnection process is herein proposed. An ultra-thin, adhesive, and conformal pore sealing layer was formed on mesoporous low-k by spin coating macromolecules. The pore sealant on the Cu surface was selectively decomposed with the help of Cu 2 O induced oxidization. This selective removal was also examined for patterned structure. Our simple and novel technique will help the integration of ulta-low-k materials in LSI devices.
Databáze: OpenAIRE