Exploring Active Learning for Semiconductor Defect Segmentation

Autor:	Lile Cai, Ramanpreet Singh Pahwa, Xun Xu, Jie Wang, Richard Chang, Lining Zhang, Chuan-Sheng Foo
Rok vydání:	2022
Zdroj:	2022 IEEE International Conference on Image Processing (ICIP).
DOI:	10.1109/icip46576.2022.9897842
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1c0362bd85f8a57b666f2a44b7c251df https://doi.org/10.1109/icip46576.2022.9897842 Zobrazit plný text záznamu