On the Combined Application of Raman Spectroscopy and Photoluminescence Spectroscopy for the Diagnostics of Multilayer Heterostructures

Autor: B. N. Zvonkov, O. V. Vikhrova, Aleksey Nezhdanov, S. M. Plankina, I. Yu. Pashen’kin, S. Yu. Zubkov, R. N. Kriukov, A. A. Sushkov, D. A. Pavlov
Rok vydání: 2019
Předmět:
Zdroj: Semiconductors. 53:1207-1210
ISSN: 1090-6479
1063-7826
DOI: 10.1134/s1063782619090148
Popis: The results of studying GaInAs/GaInP/GaAs photodiode structures grown by metal–organic vapor-phase epitaxy are reported. A procedure for the diagnostics of such multilayer structures is developed. The procedure is based on the application of Raman spectroscopy in combination with photoluminescence spectroscopy in the mode of the lateral scanning of transverse cleavages. The compositions of the GaInAs and GaInP solid solutions are determined.
Databáze: OpenAIRE
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