Integrated test concepts for in-situ millimeter-wave device characterization

Autor:	J. Nehring, Benjamin Laemmle, Andreas Oborovski, K. Borutta, Ismail Nasr, Dietmar Kissinger, Robert Weigel
Rok vydání:	2015
Předmět:	Heterodyne Engineering business.industry Electrical engineering Context (language use) Ranging law.invention Narrowband Hardware_GENERAL law Extremely high frequency Electronic engineering Radar Transceiver business Network analysis
Zdroj:	NEWCAS
DOI:	10.1109/newcas.2015.7181980
Popis:	This paper presents our recent work towards state-of-the-art integrated test concepts for the in-situ characterization of silicon-integrated millimeter-wave devices and transceiver components for radar and communication applications. Narrowband as well as ultra-broadband integrated network analysis solutions for a variety of frequency bands ranging from 50 to 120 GHz are outlined. In this context, direct-conversion and heterodyne architectures and their respective implementations in silicon-germanium technologies are discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1b93fd3224fbbd2ceec64de4c16c0766 https://doi.org/10.1109/newcas.2015.7181980 Zobrazit plný text záznamu