Beam test results of 25 $μ$m and 35 $μ$m thick FBK UFSD]{Beam test results of 25 $μ$m and 35 $μ$m thick FBK ultra fast silicon detectors

Autor: Carnesecchi, F., Strazzi, S., Alici, A., Arcidiacono, R., Borghi, G., Boscardin, M., Cartiglia, N., Vignali, M. Centis, Cavazza, D., Betta, G. -F. Dalla, Durando, S., Ferrero, M., Ficorella, F., Ali, O. Hammad, Mandurrino, M., Margotti, A., Menzio, L., Nania, R., Pancheri, L., Paternoster, G., Scioli, G., Siviero, F., Sola, V., Tornago, M., Vignola, G.
Rok vydání: 2022
Předmět:
DOI: 10.48550/arxiv.2208.05717
Popis: This paper presents the measurements on first very thin Ultra Fast Silicon Detectors (UFSDs) produced by Fondazione Bruno Kessler; the data have been collected in a beam test setup at the CERN PS, using beam with a momentum of 12 GeV/c. UFSDs with a nominal thickness of 25 $μ$m and 35 $μ$m and an area of 1 $\times$ 1 $\text{mm}^2$ have been considered, together with an additional HPK 50-$μ$m thick sensor, taken as reference. Their timing performances have been studied as a function of the applied voltage and gain. A time resolution of about 25 ps and of 22 ps at a voltage of 120 V and 240 V has been obtained for the 25 and 35 $μ$m thick UFSDs, respectively.
Databáze: OpenAIRE