| Autor: |
Matthew J. Marinella, Jennifer E. Granata, Jack Flicker, Robert Kaplar |
| Rok vydání: |
2012 |
| Předmět: |
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| Zdroj: |
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2. |
| DOI: |
10.1109/pvsc-vol2.2012.6656709 |
| Popis: |
In order to elucidate how the degradation of individual components affects the state of the photovoltaic inverter as a whole, we have carried out SPICE simulations to investigate the voltage and current ripple on the DC bus. The bus capacitor is generally considered to be among the least reliable components of the system, so we have simulated how the degradation of bus capacitors affects the AC ripple at the terminals of the PV module. Degradation-induced ripple leads to an increased degradation rate in a positive feedback cycle. Additionally, laboratory experiments are being carried out to ascertain the reliability of metallized thin film capacitors. By understanding the degradation mechanisms and their effects on the inverter as a system, steps can be made to more effectively replace marginal components with more reliable ones, increasing the lifetime and efficiency of the inverter and decreasing its cost per watt towards the US Department of Energy goals. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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