The refractive index of AlxGa1−xAs below the band gap: Accurate determination and empirical modeling

Autor:	S. Gehrsitz, A. Vonlanthen, N. Herres, F. K. Reinhart, Hans Sigg, C. Gourgon
Rok vydání:	2000
Předmět:	Diffraction Waveguide (electromagnetism) Materials science Birefringence business.industry Band gap Atomic emission spectroscopy General Physics and Astronomy Optoelectronics Chemical vapor deposition business Refractive index Molecular beam epitaxy
Zdroj:	Journal of Applied Physics. 87:7825-7837
ISSN:	1089-7550 0021-8979
Popis:	The refractive indices of AlxGa1−xAs epitaxial layers (0.176⩽x⩽1) are accurately determined below the band gap to wavelengths, λ
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1b15d1639473dd3c939b42ca5e9a5334 https://doi.org/10.1063/1.373462 Zobrazit plný text záznamu