Characterization of Structure and Damage in Materials in Four Dimensions

Autor:	David P. Field, Mitra L. Taheri, X L Wang, Thomas F. Kelly, Christopher A. Schuh, Gary S. Was, Rafal E. Dunin-Borkowski, Michael D. Uchic, Ian M. Robertson, David C. Dunand, Ian Baker, G B Thompson, Sergio Lozano-Perez, J.S. Vetrano, D J Jensen, Nigel D. Browning, Anthony D. Rollett, Bernd Kabius, Amit Misra, M. K. Miller, Gregory S. Rohrer
Rok vydání:	2010
Předmět:	Materials science Structure (category theory) Nanotechnology Characterization (materials science)
DOI:	10.2172/1124906
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1abedab0443f473af3c9881bf4e1ce90 https://doi.org/10.2172/1124906 Zobrazit plný text záznamu