| Autor: |
Fabien Pilon, Bertrand Bertussi, Jean-Claude Birolleau, Matthieu Pommiès, Audrey Surmin, David Damiani, Christophe Dujardin, Xavier Le Borgne, Hervé Piombini |
| Rok vydání: |
2006 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.695323 |
| Popis: |
In this paper we examine how optical techniques can be used for impurities and defects detection in KH 2 PO 4 (KDP) components. This is important in so far as some of these defects are responsible for a weaker than expected laser-induced threshold in these materials. Photothermal deflection, polariscopy, fluorescence and photoexcitation are investigated with the aim of localizing and identifying the laser-induced damage precursors. Impurities concentration is measured directly by ICP-AES and Fe is accordingly checked to be at the origin of a higher absorption in the prismatic sectors of rapidly grown KDP crystals. We also exhibit a fluorescence signal in the near-ultraviolet range by pumping at 248 nm; in rapidly grown crystals, in the same way as iron, the incorporation rate of the fluorescent centers is shown to depend on the growth sector. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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