Effects of Sn Layer Orientation on the Evolution of Cu/Sn Interfaces
| Autor: | Anmin Hu, Zhangjian Zhao, Huiqin Ling, Fengtian Hu, Menglong Sun, Tao Hang, Ming Li |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Diffusion Intermetallic 02 engineering and technology 021001 nanoscience & nanotechnology Microstructure 01 natural sciences Electronic Optical and Magnetic Materials Soldering 0103 physical sciences Crystallite Composite material 0210 nano-technology Electroplating Layer (electronics) Joint (geology) |
| Zdroj: | Electronic Materials Letters. 14:526-532 |
| ISSN: | 2093-6788 1738-8090 |
| DOI: | 10.1007/s13391-018-0048-8 |
| Popis: | The effects of Sn layer orientation on the evolution of Cu/Sn joint interfaces were investigated. Three Sn layers possessing (112), (321) and (420) orientations were electroplated on polycrystalline Cu substrates respectively. The orientations of Sn layer preserved during reflowing at 250 °C for 10 s. After aging at 150 °C for different time, the interfacial microstructures were observed from the cross-section and top-view. The alignment between the c-axis of Sn and Cu diffusion direction significantly sped up the Cu diffusion, leading to the thickest intermetallic compound layer formed in (112) joint. Two types of voids, namely, intracrystalline voids and grain islanding caused intercrystalline voids generated at Cu/Cu3Sn interfaces due to the different interdiffusion coefficients of Cu and Sn (112) oriented Sn/Cu joint produced many more voids than (321) joint, and no voids were detected in (420) joint. Therefore, to enhance the reliability of solder joints, using (420) oriented Sn as solder layer could be an efficient way. |
| Databáze: | OpenAIRE |
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