High reliability level demonstrated on 980nm laser diode
| Autor: | Christophe Starck, M. Bettiati, J. Van de Casteele, D. Laffitte, G. Gelly |
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| Rok vydání: | 2003 |
| Předmět: |
Materials science
Laser diode business.industry Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Vertical-cavity surface-emitting laser law.invention X-ray laser Reliability (semiconductor) law Diode-pumped solid-state laser Optoelectronics Electrical and Electronic Engineering Safety Risk Reliability and Quality business Step recovery diode |
| Zdroj: | Microelectronics Reliability. 43:1751-1754 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/s0026-2714(03)00292-0 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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