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Sn57Bi1Ag alloy system meets the basic solderability requirements while reliability of solder is less known. The presence of intermetallics that form at the solder-joint interface and in the bulk solder is the primary reason to cause joint failure on simple loading. Furthermore, dissolution of soldered surface (copper, gold, silver, nickel, etc.) into the solder during reflow alters the composition of the interface leading to the formation of intermetallic phases. The present paper addresses the characterization of low temperature Sn57Bi1Ag solder alloy, its joint interface metallurgy and integrity. Generally, formation of intermetallic phases (Cu3Sn, Cu6Sn5, Ag3Sn, AuSn2, Ni3Sn4, etc.) at the solder-pad interface is in the range of 0.3 to 1.0µm. On thermal ageing at 75°C (0.55Tm), the intermetallic phases grow further up to 2.3µm, particularly CuSn and AuSn phases. In addition, to distributed eutectic tin (Sn) and bismuth (Bi) phases, fine eutectic tin and bismuth phases and primary tin (β-Sn) are also observed. Coarsening of Bi and Sn phases is noticed on thermal ageing (75°C and 100°C). The rate of coarsening increases with the supply of thermal energy promoting Sn/Bi atomic diffusion and movement of eutectic boundaries (grain boundaries). However, the Sn-Bi interface is stable without any significant changes in eutectic structures and its morphologies. The mechanical drop test of the Sn57Bi1Ag solder joint passed 120 drops, characteristic life corresponds to the number of drops for a failure of 63.2%. Evaluated as per JESD22-B111 specification to a maximum peak acceleration of 1500G and half-sine shock pulse duration of 0.5 milliseconds, soldered the alloy to copper OSP surface. The solder joint also passed 1200cycles evaluated at -40 to +125°C. Electrical connectivity of the solder joints soldered to ENIG plated test boards is recorded continuously. Crystallographic orientation of Sn and Bi second phases is observed using electron back scattered diffraction (EBSD) of thermal aged solder joints and are also presented in this paper. |
