Cost-driven statistical analysis for selection of alternative measurements of analog circuits

Autor:	Jean-Pascal Mallet, Emeric de Foucauld, Matthieu Verdy, Suzanne Lesecq, Cedric Mayor, Alin Ratiu, Dominique Morche
Rok vydání:	2014
Předmět:	Set (abstract data type) Engineering Selection (relational algebra) Analogue electronics business.industry Monte Carlo method Electronic engineering Code coverage Statistical dispersion State (computer science) business Circuit extraction
Zdroj:	ICECS
DOI:	10.1109/icecs.2014.7049932
Popis:	In this paper, we introduce a new method for improving the use of Alternative Measurements Strategy for analog circuit testing. The goal is to reduce the test cost by selecting the cheapest set of measurements that do not bring redundant information about the state of the circuit, without reducing test coverage. The proposed method consists in finding a subset of a given set of parameters which explains the dispersion of the circuit performances. The efficiency of the proposed approach is demonstrated on a critical example using continuous-time A/D conversion.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1a67e88962937de74ac0c8fc089988a1 https://doi.org/10.1109/icecs.2014.7049932 Zobrazit plný text záznamu