Automated Data Reduction For Speckle Metrology

Autor:	Gene E. Maddux
Rok vydání:	1983
Předmět:	Reduction (complexity) Upload Data processing Speckle pattern Engineering Analogue electronics Process (engineering) business.industry Optical engineering Systems engineering Mechanical engineering business Metrology
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
DOI:	10.1117/12.933944
Popis:	Speckle Metrology has transitioned from a laboratory curiosity to a useful engineering tool. It is now in a stage where some means is required to process the enormous amount of data it is capable of generating. This paper explores the requirements and characteristics for an automated data reduction system. Examples are given of current operational systems and what direction future system developments may take.© (1983) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Databáze:	OpenAIRE
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