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ADC is a critical device of any electronic, measurement and communication system, which need to be characterized and tested precisely. This paper describes the testing of ADC with histogram method using white Gaussian noise as stimuli. The use of this signal avoids considering all other noise present in the system. Gain, offset, linearity errors and effective no. of Bits have estimated using this method. Large no. of samples have collected and applied to device under test, and then from histogram, code transition level of each code has computed. Using least square minimization technique Best fit line is determined. Gain and offset can be calculated from best fit line. ENOB is determined from the ratio of actual to ideal rms error and is compared with the previous data available in literature. Known values of nonlinearity are inserted into ideal ADC to convert it into real life ADC. Arbitrary inserted values of nonlinearities are compared with the calculated values. This paper covers the simulation of 5-bit ADC and experimental results are presented. |
