Angular Distribution of Molecules Sputtered by Gas Cluster Ion Beams and Implications for Secondary Neutral Mass Spectrometry
| Autor: | Alexander G. Shard, Ian S. Gilmore, Jonathan D. P. Counsell, Matthias Lorenz, Simon Hutton |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Ion beam
Projectile Chemistry 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology Mass spectrometry 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Ion Molecular dynamics General Energy Cluster (physics) Polar Physical and Theoretical Chemistry Atomic physics 0210 nano-technology Ejecta |
| Zdroj: | The Journal of Physical Chemistry C. 120:25317-25327 |
| ISSN: | 1932-7455 1932-7447 |
| Popis: | We present experimental data on the angular distribution of Irganox 1010 organic molecules sputtered by large argon gas cluster projectiles (E/n = 5 eV, 10 keV Ar2000). Ejection probability distributions as derived from deposit patterns on planar collector surfaces were recorded at various angles of incidence of the primary cluster ion beam. The sputtered material is ejected at polar angles, on average, greater than 45° from the surface normal. At normal incidence there is no azimuthal dependence in the ejecta distribution, but the ejecta are forward directed even at incidence angles as low as 15°. After this initial rapid change, the ejecta distribution shows a rather weak dependence on the incidence angle of the primary ion beam and the polar, and azimuthal angles of preferred ejection remain relatively constant. Ejecta distributions agree with previously published results from molecular dynamics simulations for organic molecules sputtered with large argon gas cluster projectiles and are consistent with... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|