A Reevaluation of Electric-Field Enhanced Emission Measurements for Use in Type and Charge State Determination of Point Defects

Autor:	F. Christopher Rong, Håkan Pettersson, Noble M. Johnson, Edward H. Poindexter, Hermann G. Grimmeiss, Walter R. Buchwald
Rok vydání:	1992
Předmět:	Materials science Mechanics of Materials Mechanical Engineering Electric field General Materials Science Charge (physics) State (functional analysis) Type (model theory) Atomic physics Condensed Matter Physics Crystallographic defect
Zdroj:	Materials Science Forum. :1153-1158
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.83-87.1153
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::19caa10d8c6b0c361533066f5e95d8e1 https://doi.org/10.4028/www.scientific.net/msf.83-87.1153 Zobrazit plný text záznamu