Simulation ofmicro-nano processing induced surface defects influencing KDP laser damage threshold

Autor:	姜伟 Jiang Wei, 庞启龙 Pang Qilong, 刘新艳 Liu Xinyan, 陈明君 Chen Mingjun
Rok vydání:	2010
Předmět:	Materials science Laser damage business.industry Nano Optoelectronics Electrical and Electronic Engineering business Atomic and Molecular Physics and Optics
Zdroj:	High Power Laser and Particle Beams. 22:159-164
ISSN:	1001-4322
DOI:	10.3788/hplpb20102201.0159
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::19c4a6bd012e50ffaf3dfcb423179b19 https://doi.org/10.3788/hplpb20102201.0159 Zobrazit plný text záznamu