Noise performance of a color CMOS photogate image sensor
| Autor: | Marc J. Loinaz, Andrew J. Blanksby, Bryan D. Ackland, David Andrew Inglis |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Physics
CMOS sensor Correlated double sampling Noise (signal processing) business.industry ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Image sensor format CMOS Dark-frame subtraction Computer Science::Computer Vision and Pattern Recognition Image noise Electronic engineering Optoelectronics Image sensor business |
| Zdroj: | International Electron Devices Meeting. IEDM Technical Digest. |
| DOI: | 10.1109/iedm.1997.650337 |
| Popis: | We report on the noise performance of a color CMOS photogate image sensor that supports two levels of correlated double sampling and has high conversion gain at each pixel. Imager performance is limited by low quantum efficiency and dark current non-uniformity and not by read-out circuit temporal or fixed-pattern noise. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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