Evaluation of Code Selective Histogram Algorithm For ADC Linearity Test

Autor:	Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Daisuke Iimori, Yuki Ozawa, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Rok vydání:	2022
Zdroj:	2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia).
DOI:	10.1109/icce-asia57006.2022.9954832
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::195d45211c1c4487fd8525f675829059 https://doi.org/10.1109/icce-asia57006.2022.9954832 Zobrazit plný text záznamu